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Sam Benz Receives the IEEE Joseph F. Keithley Award in Instrumentation and Measurement

Sam Benz Receives the IEEE Joseph F. Keithley Award in Instrumentation and Measurement

February 25, 2016 (PA33).  Samuel (Sam) P. Benz of the National Institute of Standards and Technology (NIST) in Boulder, CO, USA, is the latest recipient of the IEEE Joseph F. Keithley Award in Instrumentation and Measurement sponsored by Keithley Instruments, Inc. and the IEEE Instrumentation and Measurement Society. 

The Award citation is:

“For creating and disseminating quantum-based superconducting voltage standards that form the basis for worldwide precision voltage measurements.”

SNF congratulates Sam and hopes to provide more information on this event once it becomes available.