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Local Orientation Variations in YBCO Films on Technical Substrates - a Combined SEM and EBSD Study
Patrick Pahlke1,2, Max Sieger1,2, Paul Chekhonin2, Werner Skrotzki2, Alexander Usoskin3, Jan Strömer3, Jens Hänisch4, Ludwig Schultz1,2, Ruben Hühne1
1IFW Dresden, 01069 Dresden, Germany
2Dresden University of Technology, 01062 Dresden, Germany
3Bruker HTS GmbH, 63755 Alzenau, Germany
4Karlsruhe Institute of Technology, Germany
3Bruker HTS GmbH, 63755 Alzenau, Germany
4Karlsruhe Institute of Technology, Germany
E-mail: [email protected]
Abstract — Scanning electron microscope imaging and electron backscatter diffraction are applied to 400 nm thick YBCO films grown on Ni-9at.%W and ABAD-YSZ tape. On the Ni-9at.%W tape, the orientation distribution varies strongly from grain to grain, which is attributed to the different orientation of the Ni-grains with regard to the surface normal. On ABAD-YSZ the structures causing the orientation variations are observed in micrometer scale only, which is attributed to the granularity of the template. In contrast to Ni-9at.%W, where no preferred misorientation axis is notable within single Ni-grains, the orientation distribution of YBCO on the ABAD-YSZ tape is primarily caused by lattice rotations about the sample normal.
Keywords (Index Terms) — Coated conductors, EBSD, PLD, YBCO.
IEEE/CSC & ESAS SUPERCONDUCTIVITY NEWS FORUM (global edition), January 2016.
Submitted October 1, 2015; Selected November 10, 2015. Reference No. ST481; Category 5.
EUCAS 2015 preprint 1A-WT-P-01.03. The final paper version was published online in IEEE Trans. Appl. Supercond. (IEEE Xplore) DOI: 10.1109/TASC.2016.2535138, April 2016.
Submitted October 1, 2015; Selected November 10, 2015. Reference No. ST481; Category 5.
EUCAS 2015 preprint 1A-WT-P-01.03. The final paper version was published online in IEEE Trans. Appl. Supercond. (IEEE Xplore) DOI: 10.1109/TASC.2016.2535138, April 2016.