Michelle Espy, Member, IEEE, Per Magnelind, Andrei Matlashov, Shaun Newman, Algis Urbaitis, Petr Volegov

Hiroyuki Akaike, Tatsunori Funai, Naoto Naito, and Akira Fujimaki, Member, IEEE

Rongtao Lu, Alan J. Elliot, Logan Wille, Bo Mao, Siyuan Han, Judy Z. Wu, John Talvacchio, Heidi M. Schulze, Rupert M. Lewis, Daniel J. Ewing, H. F. Yu, G. M. Xue, and S. P. Zhao

Sergey K. Tolpygo, D.J.C. Amparo, R.T. Hunt, J.A. Vivalda, and D.T. Yohannes

Kevin Inderbitzin, Andreas Engel, and Andreas Schilling

Theodore Van Duzer, Life Fellow, IEEE, Lizhen Zheng, Member, IEEE, Stephen R. Whiteley, Member, IEEE, Hoki Kim, Jaewoo Kim, Xiaofan Meng, and Thomas Ortlepp

Mikko Kiviranta and Nikolai Beev

Harald W. Weber, Rainer Prokopec, Karl Humer, Reinhard K. Maix, Harald Fillunger, Juan Knaster

Roberto Zanino, Senior Member, IEEE, and Laura Savoldi Richard

Honghai Song, Member, IEEE, Paul Brownsey, Yifei Zhang, Justin Waterman, Toru Fukushima and Drew Hazelton

Alice Borceto,Daniele Damiani, Andrea Viale, Franco Bertora, Member, IEEE, and Roberto Marabotto

Gianluigi Ciovati, Steven M. Anlage, and Alexander V. Gurevich

Neil. D. Glasson, Mike. P. Staines, Zhenan Jiang, and Nathan. S. Allpress

Liye Xiao, Shaotao Dai, Liangzhen Lin, Zhifeng Zhang and Jingye Zhang

H. Ohsaki, Member, IEEE, Z. Lv, N. Matsushita, M. Sekino, Member, IEEE, T. Koseki, Member, IEEE, and M. Tomita

Hiroyasu Yumura, Yuichi Ashibe, Masayoshi Ohya, Hideki Itoh, Michihiko Watanabe, Takato Masuda, Hiroshi Ichikawa, Tomoo Mimura, Shoichi Honjo, Tsukushi Hara, Ryusuke Ohno, Masahiro Shimoda, Naoko Nakamura, Toshihiro Komagome and Hiroharu Yaguchi

V. S. Vysotsky, Senior Member IEEE, A. A. Nosov, S. S. Fetisov, G. G. Svalov, V. V. Kostyuk, E. V. Blagov, I. V. Antyukhov, V. P. Firsov, B. I. Katorgin, A. L. Rakhmanov

Fedor Gömöry, Ján Šouc, Enric Pardo, Eugen Seiler, Mykola Soloviov, Lubomír Frolek, Michal Skarba, Pavol Konopka, Marcela Pekarčíková, Jozef Janovec

R. Fair, W. Stautner, M. Douglass, R. Rajput-Ghoshal, M. Moscinski, P. Riley, D. Wagner, J. Kim, S. Hou, F. Lopez, K. Haran, J. Bray, T. Laskaris, J. Rochford, R. Duckworth

L. Martini, M. Bocchi, M. Ascade, A. Valzasina, V. Rossi, C. Ravetta, and G. Angeli

Shigeo Nagaya, Tomonori Watanabe, Tsutomu Tamada, Mitsuhito Naruse, Naoji Kashima, Toshio Katagiri, Naoki Hirano, Satoshi Awaji, Hidetoshi Oguro and Atsushi Ishiyama

Jin Wang, Member, IEEE, Ronghai Qu, Senior Member, IEEE, and Yingzhen Liu

Zheng Jun, Xie Feng, Chen Wei, Dai Yijun, Chen Jin, Tang Wenbin

Emmanuele Ravaioli, Bernhard Auchmann, and Arjan P. Verweij

P. Ferracin, M. Devaux, M. Durante, P. Fazilleau, P. Fessia, P. Manil, A. Milanese, J. E. Munoz Garcia, L. Oberli, J. C. Perez, J. M. Rifflet, G. de Rijk, F. Rondeaux, and E. Todesco