Dr. Charles H Recchia, has held technology development, reliability engineering and director-level positions at AMD, Intel Corporation, MKS Instruments, Saint-Gobain, Raytheon Integrated Defense Systems and MACOM, having earned a Ph.D. in Experimental Solid State Physics from Ohio State University focusing on nuclear magnetic resonance of high-temperature superconductors, an MBA from Babson College, with visiting academic appointments at Wittenberg University and Worcester Polytechnic Institute. He is author on 3 semiconductor technology patents, more than 20 peer-reviewed publications and has served on technical program committees for IEEE IRPS Conference and SELSE Workshops and chaired the IEEE/ASQ joint ASTR Conference.  A Senior Member of IEEE and an elected IEEE Reliability Society Advisory Committee member, Dr. Recchia served a three-year extended term as IEEE Reliability Boston Chapter Chair from 2015-2017.