AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool

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ST567

2EOr3B1-3

AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool

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February 2017

Vasili K. Semenov, Yuri A. Polyakov, and Sergey K. Tolpygo

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SNF Issue No. 63, March 2026

SNF Issue No. 63, March 2026

AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool

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Upcoming Events

The 17th IEEE Workshop on Low-Temperature Electronics

10th International Workshop on Numerical Modelling of High Temperature Superconductors

Current SNF Issue

SNF Issue No. 63, March 2026

SNF Issue No. 63, March 2026

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