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Invited

STP-718

3MOr2B-05

Advances in Nanoscale Analysis of Hf Doped Nb3Sn Wires Using Atom Probe Tomography

Laura Wheatley, Benjamin Jenkins, Chiara Tarantini, Shreyas Balachandran, Nawaraj Paudel, William Starch, Peter Lee, David Larbalestier, Paul Bagot, Susie Speller, Michael Moody, Chris Grovenor

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Paper

Slides

Wheatley presentation.pdf (2.8 MB)

Date

8 March 2023

Series

SNF Issue 52, March 2023

ASC 2022

Presentation Category

Materials

Topics

Nb3Sn

Flux Pinning

Critical Current Density

Nanostructures / Nanoparticles

Microstructural Characterization

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SNF Issue No. 63, March 2026

SNF Issue No. 63, March 2026

Advances in Nanoscale Analysis of Hf Doped Nb3Sn Wires Using Atom Probe Tomography

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Upcoming Events

The 17th IEEE Workshop on Low-Temperature Electronics

10th International Workshop on Numerical Modelling of High Temperature Superconductors

Current SNF Issue

SNF Issue No. 63, March 2026

SNF Issue No. 63, March 2026

Advances in Nanoscale Analysis of Hf Doped Nb3Sn Wires Using Atom Probe Tomography

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