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Presentation
Invited
Advances In Nanoscale Analysis of Hf Doped Nb3Sn Wires Using Atom Probe Tomography
Presentation Type
Invited
Code
STP718
3MOr2B-05
Advances in Nanoscale Analysis of Hf Doped Nb3Sn Wires Using Atom Probe Tomography
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Slides
Wheatley presentation.pdf
(2.8 MB)
Paper
Advances in Nanoscale Analysis of Hf Doped Nb3Sn Wires Using Atom Probe Tomography
